CHEMICAL ENGINEERING |
Shimadzu UV Vis Spectrophotometer (UV-1800) |
2013 |
Online SO2 Analyzer |
2015 |
Adsorption and Regeneration Reactor Column |
Gas Absorption in Spray Tower |
CIVIL ENGINEERING |
STRUDS Latest Version |
2013 |
ESRGSR Latest Version |
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Shimadzu UV Vis Spectrophotometer (UV-1800) |
|
Total Station |
2014 |
COMPUTER SCIENCE and ENGINEERING |
Comprehensive LAN Security Test Bid |
2013 |
TESLA C 2070 Based System (NVIDIA Tesla C2075 Cards) |
|
ELECTRICAL ENGINEERING |
Three Phase Power Quality Analyzer (Fluke-435) |
2014 |
ELECTRONICS & COMMUNICATION ENGINEERING |
Agilent’s ADS for RF CKT (Part No. E 8900-10327) |
2012 |
Agilent’s Golden Gate (Part No. W 2001-10021) |
XUP Xilinx Virtex-6 Board |
2013 |
XUP Xilinx Virtex 5 Open SPARC Board |
Xilinx Zynq- 7000 SoC Video and Imaging Kit |
VSWR Meter |
S-Band Microwave Test Bench |
Advanced Microstrip Trainer Kit (MIC) |
Keil Evaluation Board (Keil MCB STR9-ED) |
Keil Evaluation Board (Keil MCB 2929-ED) |
KeilUlink 2-ED USB-JTAG Interface Adapter (Keil ULINK2-ED) |
RF Analyzer |
2015 |
MATERIALS RESEARCH CENTRE |
2014 |
AAs with Graphite Furnace (Model No. 72810004, Atomic Absorption Spectrophotometer AA-8000) |
MECHANICAL ENGINEERING |
2015 |
Motorized Hydraulic Press |
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Pillar Type Heavy Duty Geared Power Press- H-Type |
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Surtronic 100 Surface Measuring Instrument |
|
Automatic Weather Station |
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Five Gas Analyzer |
|
METALLURGICAL and MATERIALS ENGINEERING |
Q500 MC-Leica Image Analysis System (Spare Parts) |
2012 |
Microwave Furnace 1600 degree C |
Computerized Brinell Hardness Tester |
2014 |
Computerized Vicker Hardness Tester |
Portable Electronic Dynamic Hardness Tester |
2015 |
Differential Scanning Calorimeter (DSC) |
Optical Microscope |